Author name: Huan Zhang, Lianghong Tan, Yichu Xu, Jiangzhong Cao, Huanqi Wu, Linwei Zhu, Xu Zhang

arXiv:2605.04635v1 Announce Type: new
Abstract: Printed Circuit Board (PCB) defect inspection faces two compounding challenges: scarce and imbalanced defect samples that limit model training, and insufficient feature representation under complex circu…