cs.CV, eess.IV, physics.ins-det

Neural Field-Based 3D Surface Reconstruction of Microstructures from Multi-Detector Signals in Scanning Electron Microscopy

arXiv:2508.04728v2 Announce Type: replace-cross
Abstract: The 3D characterization of microstructures is crucial for understanding and designing functional materials. However, the scanning electron microscope (SEM), widely used in scientific research, …